Prime Grade generally refers to high-quality polished monocrystalline silicon wafers intended for semiconductor devices, integrated circuits, and demanding research processes. The grade emphasizes material quality, polished-surface condition, geometric performance, and parameter completeness.
Product Overview
SciMater™ Prime Grade Single-Side Polished Monocrystalline Silicon Wafers are manufactured from high-purity single-crystal silicon. One surface is precision chemical-mechanical polished to provide a flat, smooth, process-ready surface, while the back surface is typically lapped, etched, or finished according to the actual production batch.
These wafers are suitable for semiconductor devices, micro- and nanofabrication, thin-film deposition, photolithography, etching, MEMS, sensors, optoelectronics, and university research. Standard options include 2-inch, 3-inch, 4-inch, 5-inch, and 6-inch wafers, with N-type, P-type,<100>,<111>, multiple resistivity ranges, and special thicknesses available.
Prime Grade products emphasize material quality, polished-surface condition, geometric performance, and downstream process compatibility. Electrical parameters, thickness tolerance, TTV, Bow, Warp, and surface specifications are subject to the confirmed order or corresponding batch documentation.
Key Features
Product Size Comparison
| Wafer Size | Nominal Diameter | Product Grade | Polishing | Conductivity Type | Common Orientation |
|---|---|---|---|---|---|
| 2 Inch | Ø50.8 mm | Prime Grade | Single-Side Polished | N-Type / P-Type | <100>/<111> |
| 3 Inch | Ø76.2 mm | Prime Grade | Single-Side Polished | N-Type / P-Type | <100>/<111> |
| 4 Inch | Ø100 mm | Prime Grade | Single-Side Polished | N-Type / P-Type | <100>/<111> |
| 5 Inch | Ø125 mm | Prime Grade | Single-Side Polished | N-Type / P-Type | <100>/<111> |
| 6 Inch | Ø150 mm | Prime Grade | Single-Side Polished | N-Type / P-Type | <100>/<111> |
Optional Technical Parameters
| Parameter | Available Range or Description |
|---|---|
| Wafer Material | High-purity monocrystalline silicon |
| Product Grade | Prime Grade |
| Polishing | Single-side polished; the front is the primary process surface, and the back surface depends on the production batch |
| Conductivity Type | N-type or P-type; intrinsic undoped options may be confirmed separately |
| Dopant | Phosphorus is common for N-type and boron for P-type; final details follow the order or inspection documents |
| Crystal Orientation | <100>and<111>; other orientations may be available upon request |
| Resistivity | Low, standard, and high-resistivity ranges can be evaluated |
| Thickness | Standard, thin, thick, and custom thickness options |
| Surface Condition | Bare polished silicon by default; SiO₂, Si₃N₄, and metal coatings require separate customization |
| Orientation Feature | Primary flat, secondary flat, or notch according to wafer size and batch |
| Geometric Parameters | Thickness tolerance, TTV, Bow, and Warp can be confirmed according to project requirements |
| Cutting Services | Square, rectangular, circular, laser-scribed, special-shaped, and drilled parts |
| Packaging | Single-wafer box, multi-wafer box, vacuum packaging, clean bag, or customized packaging |
| Inspection Documents | Batch labels, parameter sheets, or inspection reports subject to actual supply conditions |
TTV describes wafer thickness uniformity, while Bow and Warp describe the wafer's overall curvature and flatness. For high-precision photolithography, bonding, or device fabrication, acceptable limits should be clearly specified before ordering.
Prime Grade vs. Standard Laboratory / Test Grade
| Comparison Item | Prime Grade SSP Silicon Wafer | Standard Laboratory / Test Grade Wafer |
|---|---|---|
| Product Positioning | Semiconductor processing, device fabrication, and demanding research projects | Teaching demonstrations, equipment setup, and general materials experiments |
| Surface Quality | Higher requirements for polished-surface quality and surface condition | May contain minor scratches, particles, or cosmetic defects |
| Geometric Performance | Greater emphasis on thickness, TTV, Bow, and Warp | Relatively relaxed geometric requirements |
| Parameter Completeness | Size, orientation, type, resistivity, and thickness are generally specified | Some products may be parameter-unknown or reclaimed/process wafers |
| Process Compatibility | Suitable for lithography, etching, deposition, oxidation, and device fabrication | Suitable for non-critical experiments or equipment testing |
| Purchase Cost | Relatively higher | Relatively lower |
Main Applications
Selection Guide
| Application Requirement | Recommended Selection |
|---|---|
| General material deposition, lithography, or teaching | 2-inch or 3-inch Prime Grade SSP wafer |
| Standard micro-/nanofabrication and equipment compatibility | 4-inch Prime Grade SSP wafer |
| Pilot-scale processing or larger-area thin films | 5-inch or 6-inch Prime Grade SSP wafer |
| MOS, oxide-layer, or interface research | Confirm conductivity type, orientation, resistivity, and surface oxidation condition |
| Wet etching or orientation-dependent processing | Select<100>or<111>according to the etching process |
| Electrodes and electrical devices | Choose N-type or P-type according to the device design and confirm the resistivity range |
| High insulation or low-background-current testing | Choose high-resistivity or intrinsic undoped silicon wafers |
| Thin-film characterization or small-area experiments | Purchase full wafers for in-house dicing or order custom-cut pieces |
| High-precision lithography or wafer bonding | Confirm TTV, Bow, Warp, particle level, and surface-quality requirements |
How to Use
Storage and Maintenance
| Item | Recommendation |
|---|---|
| Storage Environment | Keep dry and clean; avoid high humidity, high temperatures, and corrosive gases |
| Packaging | Keep unused wafers in the original package, wafer box, or clean vacuum bag |
| Surface Protection | Prevent the polished surface from rubbing against hard objects, plastic debris, or paper fibers |
| Handling and Transport | Use wafer boxes or dedicated carriers; avoid stacking bare wafers |
| Opened Packages | Use promptly after opening; reseal remaining wafers and retain batch information |
| Long-Term Storage | Use a clean, dry cabinet and minimize repeated opening to reduce particle contamination |
| Process Records | Record batch number, specifications, cleaning method, and process conditions for traceability |
Bare silicon develops a native oxide layer after exposure to air. For experiments sensitive to interface chemistry, surface condition, or ultrathin-film deposition, define the cleaning, oxide-removal, and surface-pretreatment procedure in advance.
Recommended Ordering Information
To improve product selection and order confirmation efficiency, provide your requirements in the following format:
Example: 4 inch + single-side polished + P-type +<100>+ 1–10 Ω·cm + standard thickness + 25 wafers + individually packed
For custom cutting, also provide: cut size + thickness + cutting method + quantity + dimensional tolerance + cleaning requirement + packaging requirement.





